ATOMIC FORCE MICROSCOPY AT ULTRASONIC FREQUENCIES
نویسندگان
چکیده
منابع مشابه
Atomic Force Microscopy at Ultrasonic Frequencies
Atomic Force Microscopy (AFM) is a near-field technique to generate high-resolution images of surfaces. A micro-fabricated elastic beam with an integrated sharp sensor tip at its end is scanned over the sample surface. With various dynamic modes, leading to Force Modulation Microscopy [1], Ultrasonic Force Microscopy [2], Atomic Force Acoustic Microscopy (AFAM) [3–5], Microdeformation Microscop...
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Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
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ژورنال
عنوان ژورنال: Proceedings of the Asian Pacific Conference on Fracture and Strength and International Conference on Advanced Technology in Experimental Mechanics
سال: 2001
ISSN: 2433-1279
DOI: 10.1299/jsmeatemapcfs.1.01.203.0_41